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  ? 2008 ixys corporation, all rights reserved symbol test conditions maximum ratings v dss t j = 25 c to 150 c 500 v v dgr t j = 25 c to 150 c, r gs = 1m 500 v v gss continuous 30 v v gsm transient 40 v i d25 t c = 25 c 40 a i dm t c = 25 c, pulse width limited by t jm 160 a i a t c = 25 c 40 a e as t c = 25 c 2.5 j dv/dt i s i dm , v dd v dss , t j 150 c 20 v/ns p d t c = 25 c 560 w t j -55 ... +150 c t jm 150 c t stg -55 ... +150 c t l 1.6mm (0.063 in) from case for 10s 300 c m d mounting torque 1.13/10 nm/lb.in. weight 10 g hiperfet tm power mosfet q2-class n-channel enhancement mode avalanche rated, high dv/dt, low q g low intrinsic r g , low t rr features double metal process for low gate resistance international standard package epoxy meet ul 94 v-0, flammability classification avalanche energy and current rated fast intrinsic rectifier applications dc-dc converters switched-mode and resonant-mode power supplies, >500khz switching dc choppers pulse generation laser drivers advantages easy to mount space savings high power density symbol test conditions characteristic values (t j = 25 c, unless otherwise specified) min. typ. max. bv dss v gs = 0v, i d = 250 a 500 v v gs(th) v ds = v gs , i d = 4ma 3.0 5.5 v i gss v gs = 30v, v ds = 0v 200 na i dss v ds = v dss 25 a v gs = 0v t j = 125 c 1 ma r ds(on) v gs = 10v, i d = 0.5 ? i d25 , note 1 160 m g = gate d = drain s = source tab = drain ds100035(08/08) v dss = 500v i d25 = 40a r ds(on) 160m t rr 250ns IXFK40N50Q2 to-264 (ixfk) s g d (tab) preliminary technical information
ixys reserves the right to change limits, test conditions, and dimensions. IXFK40N50Q2 symbol test conditions characteristic values (t j = 25 min. typ. max. g fs v ds = 10v, i d = 0.5 ? i d25 , note 1 15 28 s c iss 4850 pf c oss v gs = 0v, v ds = 25v, f = 1mhz 680 pf c rss 170 pf t d(on) resistive switching times 17 ns t r v gs = 10v, v ds = 0.5 ? v dss , i d = 0.5 ? i d25 13 ns t d(off) r g = 2 t f 8 ns q g(on) 110 nc q gs v gs = 10v, v ds = 0.5 ? v dss , i d = 0.5 ? i d25 25 nc q gd 50 nc r thjc 0.22 r thck 0.15 source-drain diode symbol test conditions characteristic values (t j = 25 min. typ. max. i s v gs = 0v 40 a i sm repetitive, pulse width limited by t jm 160 a v sd i f = i s , v gs = 0 v, note 1 1.5 v t rr 250 ns q rm 1 c i rm 9 a i f = 25a, -di/dt = 100 a/ s, v r = 100 v ixys mosfets and igbts are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 b1 6,683,344 6,727,585 7,005,734 b2 7,157,338b2 by one or more of the following u.s. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 b1 6,534,343 6,710,405 b2 6,759,692 7,063,975 b2 4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 b1 6,583,505 6,710,463 6,771,478 b2 7,071,537 notes: 1. pulse test, t to-264 (ixfk) outline preliminary technical information the product presented herein is under development. the technical specifications offered are derived from data gathered during objective characterizations of preliminary engineering lots; but also may yet contain some information supplied during a pre-production design evaluation. ixys reserves the right to change limits, test conditions, and dimensions without notice.
? 2008 ixys corporation, all rights reserved IXFK40N50Q2 fig. 2. extended output characteristics @ 25 o c 0 10 20 30 40 50 60 70 80 90 036912151821242730 v d s - volts i d - amperes v gs = 10v 8v 5v 6v 7v fig. 3. output characteristics @ 125 o c 0 5 10 15 20 25 30 35 40 0 2 4 6 8 10121416 v d s - volts i d - amperes 4.5v 5.5v 5v 6v v gs = 10v 7v fig. 1. output characteristics @ 25 o c 0 5 10 15 20 25 30 35 40 01234567 v d s - volts i d - amperes v gs = 10v 7v 6v 5v 5.5v 4.5v fig. 4. r ds(on ) normalized to 0.5 i d25 v alue vs. junction temperature 0.4 0.8 1.2 1.6 2.0 2.4 2.8 3.2 -50 -25 0 25 50 75 100 125 150 t j - degrees centigrade r d s ( o n ) - normalized i d = 40a i d = 20a v gs = 10v fig. 6. drain current vs. case temperature 0 5 10 15 20 25 30 35 40 45 -50 -25 0 25 50 75 100 125 150 t c - degrees centigrade i d - amperes fig. 5. r ds(on) normalized to 0.5 i d25 value vs. i d 0.6 1.0 1.4 1.8 2.2 2.6 3.0 3.4 0 102030405060708090100 i d - amperes r d s ( o n ) - normalized t j = 125oc t j = 25oc v gs = 10v
ixys reserves the right to change limits, test conditions, and dimensions. IXFK40N50Q2 fig. 11. capacitance 100 1000 10000 0 5 10 15 20 25 30 35 40 v d s - volts capacitance - picofarads c iss c oss c rss f = 1mhz fig. 10. gate charge 0 1 2 3 4 5 6 7 8 9 10 0 102030405060708090100110 q g - nanocoulombs v g s - volts v ds = 250v i d = 20a i g = 10ma fig. 7. input admittance 0 5 10 15 20 25 30 35 40 45 50 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5 v g s - volts i d - amperes t j = 125oc 25oc - 40oc fig. 8. transconductance 0 5 10 15 20 25 30 35 40 45 50 55 0 5 10 15 20 25 30 35 40 45 50 55 60 65 i d - amperes g f s - siemens t j = - 40oc 25oc 125oc fig. 9. source current vs. source-to-drain voltage 0 10 20 30 40 50 60 70 80 90 100 110 120 0.40.50.60.70.80.91.01.11.2 v s d - volts i s - amperes t j = 125oc t j = 25oc fig. 12. forward-bias safe operating area 1 10 100 1000 10 100 1000 v d s - volts i d - amperes 100s 1ms dc t j = 150oc t c = 25oc single pulse r ds(on) limi t 10ms 25 s
? 2008 ixys corporation, all rights reserved IXFK40N50Q2 fig. 13. maximum transient thermal impedance 0.00 0.01 0.10 1.00 0.1 1 10 100 1000 10000 pulse width - milliseconds z ( t h ) j c - o c / w ixys ref: f_40n50q2 (84)5-28-08-c


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